Glossar
| # | A | B | C | D | E | F |
| G | H | I | J | K | L | M |
| N | O | P | Q | R | S | T |
| U | V | W | X | Y | Z | |
Begriffe | ||||||
| Macro Process Mapping (macro process mapping) | ||||||
| Managementprozesse (management processes) | ||||||
| Managementsystem (management system) | ||||||
| Mangel (defect) | ||||||
| Maschinenfähigkeitsindex – kritischer (Cmk) (critical machine capability index) | ||||||
| Maschinenfähigkeitsindex – potenzieller (Cm) (potential machine capability index) | ||||||
| Massenfertigung (mass production) | ||||||
| Master Black Belt | ||||||
| Mean Time Between Failure (MTBF) | ||||||
| Mean Time To Repair (MTTR) | ||||||
| Median (median) | ||||||
| Merkmale mit besonderer Bedeutung (special characteristics) | ||||||
| Messabweichung (measurement error) | ||||||
| ||||||
| Messabweichung – systematische (systematic error) | ||||||
| Messgenauigkeit (accuracy of measurement) | ||||||
| Messgerät (measuring instrument) | ||||||
| Messmittelfähigkeitsindex – kritischer (Cgk) (gage capability index, critical (Cgk)) | ||||||
| Messmittelfähigkeitsindex – potenzieller (Cg) (gage capability index, potential (Cg)) | ||||||
| Messsystem (measurement system) | ||||||
| Messung (measurement) | ||||||
| Messunsicherheit (measurement uncertainty) | ||||||
| Messverfahren (measurement procedure, standard operating procedure) | ||||||
| Methoden-KVP | ||||||
| Micro Process Mapping (micro process mapping) | ||||||
| Mitarbeiter-KVP | ||||||
| Mittelwert (mean) | ||||||
| Muda | ||||||
| Mura | ||||||
| Muri |